To learn more about reserving equipment, please contact the lab coordinator, Dr. Robert J. Bonenberger Jr., at rjbon@umd.edu or (301) 405-2612.

• Hysitron TriboIndenter nanomechanical testing system
• NanoSurf easyScan dynamic force microscope (DFM)
• NanoSurf easyScan scanning tunneling microscope (E-STM)
• JEOL JSM-5400 scanning electron microscope
• Blake Industries 4-circle Huber x-ray diffractometer system
• MTS 810 hydraulic universal testing machine (55,000 lb)
• Tinius Olsen H25K-T benchtop universal testing machine (5,000 lb)
• Tinius Olsen 602 torsion testing machine (10,000 in-lb)
• Tinius Olsen IT 504 impact tester for plastics (16 ft-lb)
• Tinius Olsen 84 impact tester for metals (300 ft-lb)
• United Tru-Blue II universal hardness tester
• Allied HTP MetPrep3 grinder/polisher with AP-3 power head
• Allied HTP TechPress2 automatic mounting press
• Allied HTP TechCut4 precision low speed saw
• Nikon Optiphot 66 optical microscope (x 2)
• Buehler ViewMet inverted metallograph
• Denton Vacuum Desk IV cold sputter/etch unit
• ThermTest TT-TC-01 thermal conductivity instrument
• Anter horizontal dilatometer (1000 deg.C)
• Nabertherm LT 24/11 programmable muffle furnace
• VWR 1330GM gravity convection oven
• Thermolyne F21135 tube furnace (x 2)
• Micromanipulator 6000 AO manual wafer prober
• Rucker & Kolls 250 manual wafer prober
• Hewlett-Packard 4275A multi-frequency LCR meter (x 2)
• J.A. Woollam Co. α-SE Teaching Ellipsometer
• Keithley 2400 source meter (x 2)
• Keithley 237 high voltage source measure unit
• Keithley 228 voltage/current source (x 2)
• Malvern Zetasizer Nano ZS90 particle analyzer
• Radiant Technologies Precision Premier II ferroelectric analyzer